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Nonlinear Dynamics of Cantilever Tip-Sample Surface Interactions in Atomic Force Microscopy

Downloads: 7         Pages: 31

Published: 2 years ago

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A study on Cantilever Tip-Sample Surface using a Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy


John H. Cantrell, Sean A. Cantrell

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