Advanced Electron Microscopy Techniques on Semiconductor Nanowires: from Atomic Density of States Analysis to 3D Reconst - PDF

Advanced Electron Microscopy Techniques on Semiconductor Nanowires: from Atomic Density of States Analysis to 3D Reconst
A study on advanced techniques in electron microscopy, a study using a type of microscope that uses an electron beam to illuminate a specimen and produce a magnified image, on semiconductor nanowires covering atomic density of states analysis to 3D reconstruction models.
This is only PDF preview of first few pages of Advanced Electron Microscopy Techniques on Semiconductor Nanowires: from Atomic Density of States Analysis to 3D Reconst by Sonia Conesa-Boj, Sonia Estrade, Josep M. Rebled, . Please download the full version to read the complete book.
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