Advanced Electron Microscopy Techniques on Semiconductor Nanowires: from Atomic Density of States Analysis to 3D Reconst
Advanced Electron Microscopy Techniques on Semiconductor Nanowires: from Atomic Density of States Analysis to 3D Reconst is a free 31-page science (academic) ebook by Sonia Conesa-Boj, Sonia Estrade, Josep M. Rebled, , published Nov 2013. It is free to download in PDF, ePub, and Kindle formats — no payment required.
- / Home
- / Science (Academic) Books /
Author: Sonia Conesa-Boj, Sonia Estrade, Josep M. Rebled,
Downloads: 99
Visits: 1
Pages: 31
Published: 12 years agoRating: Rated: 0 times Rate It
- 1 star
- 2 stars
- 3 stars
- 4 stars
- 5 stars
Add to LibraryBook Description
A study on advanced techniques in electron microscopy, a study using a type of microscope that uses an electron beam to illuminate a specimen and produce a magnified image, on semiconductor nanowires covering atomic density of states analysis to 3D reconstruction models.
Last updated: January 21, 2014
Reader Reviews
